DocumentCode :
3098778
Title :
Room temperature Plasma Assisted Atomic Layer Deposition Al2O3 film´s encapsulation application in Organic Light Emitting Diodes
Author :
Fu, Richard ; Chen, Andrew ; Srour, Merric ; Blomquist, Steven ; Forsythe, Eric ; Shi, Jianmin ; Morton, David
Author_Institution :
Sensors & Electron Devices Directorate, U.S. Army Res. Lab., Adelphi, MD, USA
fYear :
2011
fDate :
7-9 Dec. 2011
Firstpage :
1
Lastpage :
2
Abstract :
Organic Light Emitting Diodes (OLED) are made from multilayer organic polymers and electrodes that can produce light. However, OLEDs are required to be protected from oxygen, moisture by encapsulation or seal, generally using a metal cap. The metal cap is heavier, larger and expensive. On the other hand, Plasma Assisted Atomic Layer Deposition (ALD) of Al2O3 film is dense, thin, and conformal [1-2]. These properties are ideal for encapsulation thin films. Room temperature (25°C) Al2O3 films were deposited using Cambridge Nanotech Fiji ALD system by oxygen plasma assisted atomic layer deposition with Trimethyl Aluminum (TMA) as the precursor, which had good uniformity and density across an area of 80 cm2. Veeco Nanoman AFM 3D images in Fig. 1 revealed that films were smooth and uniform, as none of the films had roughness more than 1 nm at different thicknesses. Al2O3 films´ roughness slightly increased with increasing the film´s thickness. The Al2O3 film´s dielectric constant was extracted and calculated based on C-V curve, and dielectric constant 7.1 indicated a good quality of Al2O3 film at room temperature using plasma ALD, compared with 3 being the worst quality of Al2O3 film and 9 the best.
Keywords :
alumina; atomic layer deposition; dielectric thin films; encapsulation; image processing; organic light emitting diodes; permittivity; plasma deposition; thin film devices; Al2O3; C-V curve; Cambridge Nanotech Fiji ALD system; OLED; Veeco Nanoman ATM 3D image; encapsulation thin film; film dielectric constant; film roughness; film thickness; metal cap; multilayer organic electrode; multilayer organic polymer; organic light emitting diode; oxygen plasma assisted atomic layer deposition; room temperature plasma assisted atomic layer deposition Al2O3 film; temperature 293 K to 298 K; trimethyl aluminum; Aluminum oxide; Encapsulation; Films; Organic light emitting diodes; Plasma temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4577-1755-0
Type :
conf
DOI :
10.1109/ISDRS.2011.6135215
Filename :
6135215
Link To Document :
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