Title :
Functional testing of modern microprocessors
Author :
Verhallen, Th J W ; van de Goor, A.J.
Author_Institution :
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
Abstract :
In the early 1980s, a method was developed for functional testing of microprocessors. Modern microprocessors have a functionality, such as on-chip caches, which is not covered by that model. This paper extends that functional model and proposes fault models, together with tests for such modern microprocessors. The proposed concepts and algorithms have been applied to the Intel i860 microprocessor chip
Keywords :
buffer storage; failure analysis; integrated circuit testing; microprocessor chips; Intel i860 microprocessor chip; fault models; functional testing; on-chip caches; Automatic testing; Built-in self-test; Hardware; Logic testing; Memory management; Microprocessors; Modems; Performance evaluation; System testing; Very large scale integration;
Conference_Titel :
Design Automation, 1992. Proceedings., [3rd] European Conference on
Conference_Location :
Brussels
Print_ISBN :
0-8186-2645-3
DOI :
10.1109/EDAC.1992.205953
