• DocumentCode
    3099011
  • Title

    Fabrication of CMUTs with substrate-embedded springs

  • Author

    Byung Chul Lee ; Nikoozadeh, Amin ; Kwan Kyu Park ; Khuri-Yakub, Butrus T.

  • Author_Institution
    E.L. Ginzton Lab., Stanford Univ., Stanford, CA, USA
  • fYear
    2013
  • fDate
    21-25 July 2013
  • Firstpage
    1733
  • Lastpage
    1736
  • Abstract
    A capacitive micromachined ultrasonic transducer (CMUT) with substrate-embedded springs, called post-CMUT (PCMUT), decouples the spring constant and the mass of the system by realizing the former using relatively long and narrow posts. The PCMUT improves on the fill factor and average volume displacement of the conventional CMUT as shown in our previous work using 3-D finite element analysis (FEA). This work reports on second-generation PCMUT devices designed according to our 3-D FEA simulation results and manufactured using an improved fabrication process flow. This improved fabrication process is composed of three critical steps: wafer bonding of two silicon-on-insulator (SOI) wafers, deep reactive-ion etching (DRIE) of posts (i.e. springs), and precision wafer polishing. The improved fabrication process results in a flexible platform for 82-element 1-D arrays, a single element device for high-intensity focused ultrasound (HIFU), and test PCMUT element structures. The new fabrication process also provides better post high uniformity as well as a clear path toward making 2-D arrays.
  • Keywords
    finite element analysis; sputter etching; ultrasonic transducers; 3D finite element analysis; CMUT; FEA; capacitive micro machined ultrasonic transducer; deep reactive ion etching; high-intensity focused ultrasound; second-generation; silicon-insulator wafers; substrate-embedded springs; wafer bonding; Harmonic analysis; Lead; Silicon; Springs; Substrates; Transducers; CMUT; FEA; MEMS; PCMUT; Ultrasound; substrate-embedded springs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2013 IEEE International
  • Conference_Location
    Prague
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4673-5684-8
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2013.0442
  • Filename
    6725162