• DocumentCode
    3099054
  • Title

    A synthesis for testability technique for PLA-based finite state machines

  • Author

    Chakradhar, Srimat T. ; Kanjilal, Suman ; Agrawal, Vishwani D.

  • Author_Institution
    C&C Res. Labs., NEC, Princeton, NJ, USA
  • fYear
    1992
  • fDate
    16-19 Mar 1992
  • Firstpage
    361
  • Lastpage
    365
  • Abstract
    Proposes a method of testable synthesis in which a test function is incorporated into the state diagram of the object machine. The authors constrain logic minimization such that a fault has predictable effect on the composite machine (object machine embedded with the test function). This allows effective use of the test function, even when both object and test machines are faulty. A valid test sequence for a crosspoint fault is obtained by augmenting the combinational test with pre-designed O(log2 n) initialization and propagation sequences. Experimental results on the Synthesis benchmark set are given
  • Keywords
    computational complexity; design for testability; finite state machines; integrated circuit testing; logic CAD; logic arrays; minimisation of switching nets; PLA-based finite state machines; Synthesis benchmark set; combinational test; crosspoint fault; faulty machines; initialization; logic minimization; programmable logic array; propagation sequences; state diagram; synthesis for testability technique; test function; valid test sequence; Automata; Benchmark testing; Encoding; Laboratories; Logic testing; Minimization; National electric code; Predictive models; Programmable logic arrays; Proposals;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1992. Proceedings., [3rd] European Conference on
  • Conference_Location
    Brussels
  • Print_ISBN
    0-8186-2645-3
  • Type

    conf

  • DOI
    10.1109/EDAC.1992.205955
  • Filename
    205955