DocumentCode :
3099057
Title :
Non-destructive resonant frequency measurement on MEMS actuators
Author :
Smith, Norman F. ; Tanner, Danelle M. ; Swanson, Scot E. ; Miller, Samuel L.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
2001
fDate :
2001
Firstpage :
99
Lastpage :
105
Abstract :
Resonant frequency measurements provide useful insight into the repeatability of microelectromechanical systems (MEMS) manufacturing processes. Several techniques are available for making this measurement. All of these techniques however, tend to be destructive to devices which experience sliding friction, since they require the device to be operated at resonance. A nondestructive technique is presented which does not require the device to be continually driven at resonance. This technique was demonstrated on a variety of MEMS actuators
Keywords :
frequency measurement; microactuators; nondestructive testing; resonance; semiconductor device measurement; sliding friction; MEMS actuators; MEMS manufacturing processes; destructive techniques; microelectromechanical systems manufacturing processes; nondestructive resonant frequency measurement; nondestructive technique; repeatability; resonance operation; resonant frequency measurements; sliding friction; Actuators; Electrical resistance measurement; Equations; Frequency measurement; Manufacturing; Mass production; Microelectronics; Micromechanical devices; Resonance; Resonant frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 2001. Proceedings. 39th Annual. 2001 IEEE International
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-6587-9
Type :
conf
DOI :
10.1109/RELPHY.2001.922888
Filename :
922888
Link To Document :
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