DocumentCode
3099116
Title
Fabrication of ZnO homojunction by Al-As-N tridoping
Author
Balakrishnan, L. ; Gowrishankar, S. ; Gopalakrishnan, N.
Author_Institution
Dept. of Phys., Nat. Inst. of Technol., Tiruchirappalli, India
fYear
2011
fDate
7-9 Dec. 2011
Firstpage
1
Lastpage
2
Abstract
In recent years, ZnO has received great attention for optoelectronic applications (UV LEDs and LDs) because of its splendor properties such as high excitonic binding energy, high optical gain, and high radiation & temperature stability. In order to develop these ZnO based optoelectronic devices, the first step is the fabrication of high quality n- and p-type ZnO thin films. It is easy to grow low resistive and stable n-ZnO films because of the presence of native donor defects (VO and Zni). But, the p-conductivity can be realized only by suppressing these defects with suitable dopants. Different doping methods such as monodoping, codoping and cluster doping have been tried to realize low resistive p-ZnO but only few of them have succeeded despite the stability of p-conduction remains to be answered [1].
Keywords
Hall effect; II-VI semiconductors; Rutherford backscattering; X-ray chemical analysis; X-ray diffraction; X-ray photoelectron spectra; aluminium; aluminium compounds; arsenic; electrical resistivity; lattice energy; nitrogen; photoluminescence; semiconductor doping; semiconductor thin films; sputter deposition; wide band gap semiconductors; zinc compounds; EDS; GaAs; Hall measurement; Madelung energy; RBS; Rutherford backscattering; X-ray diffraction; X-ray photoelectron spectroscopy; XPS; XRD; ZnO:Al,As,N; ZnO:AlN; energy dispersive spectroscopy; hole concentration; homojunction; photoluminescence; resistivity; shallow acceptor; sputtering; stoichiometry; temperature 293 K to 298 K; thermal energy; thin film; tridoping; Doping; Fabrication; Films; Substrates; Temperature; Temperature measurement; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location
College Park, MD
Print_ISBN
978-1-4577-1755-0
Type
conf
DOI
10.1109/ISDRS.2011.6135234
Filename
6135234
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