• DocumentCode
    3099116
  • Title

    Fabrication of ZnO homojunction by Al-As-N tridoping

  • Author

    Balakrishnan, L. ; Gowrishankar, S. ; Gopalakrishnan, N.

  • Author_Institution
    Dept. of Phys., Nat. Inst. of Technol., Tiruchirappalli, India
  • fYear
    2011
  • fDate
    7-9 Dec. 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In recent years, ZnO has received great attention for optoelectronic applications (UV LEDs and LDs) because of its splendor properties such as high excitonic binding energy, high optical gain, and high radiation & temperature stability. In order to develop these ZnO based optoelectronic devices, the first step is the fabrication of high quality n- and p-type ZnO thin films. It is easy to grow low resistive and stable n-ZnO films because of the presence of native donor defects (VO and Zni). But, the p-conductivity can be realized only by suppressing these defects with suitable dopants. Different doping methods such as monodoping, codoping and cluster doping have been tried to realize low resistive p-ZnO but only few of them have succeeded despite the stability of p-conduction remains to be answered [1].
  • Keywords
    Hall effect; II-VI semiconductors; Rutherford backscattering; X-ray chemical analysis; X-ray diffraction; X-ray photoelectron spectra; aluminium; aluminium compounds; arsenic; electrical resistivity; lattice energy; nitrogen; photoluminescence; semiconductor doping; semiconductor thin films; sputter deposition; wide band gap semiconductors; zinc compounds; EDS; GaAs; Hall measurement; Madelung energy; RBS; Rutherford backscattering; X-ray diffraction; X-ray photoelectron spectroscopy; XPS; XRD; ZnO:Al,As,N; ZnO:AlN; energy dispersive spectroscopy; hole concentration; homojunction; photoluminescence; resistivity; shallow acceptor; sputtering; stoichiometry; temperature 293 K to 298 K; thermal energy; thin film; tridoping; Doping; Fabrication; Films; Substrates; Temperature; Temperature measurement; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium (ISDRS), 2011 International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4577-1755-0
  • Type

    conf

  • DOI
    10.1109/ISDRS.2011.6135234
  • Filename
    6135234