Title :
Static Calibration and Dynamic Characterization of PMUs at NIST
Author :
Stenbakken, Gerard ; Nelson, Tom
Author_Institution :
Nat. Inst. of Stand. & Technol., U.S. Dept. of Commerce, Gaithersburg, MD
Abstract :
This paper describes the development of two test systems at NIST aimed at improving the calibration and characterization of coordinated universal time (UTC) synchronized electric power instrumentation. Reference to UTC is used to meet the need for precise time synchronization of instrumentation designed to monitor the state of the grid over its wide geographic area. The first test system is used to perform calibrations of phasor measurement units (PMUs) for parameters that have performance requirements specified in IEEE standard for synchrophasors for power systems, IEEE standard C37.118-2005. Tests performed on this system use static electric power signals. The second test system is being developed to perform dynamic tests of PMUs. This paper also describes the development of a PMU testing guideline by an industry wide task force as part of the Eastern Interconnect Phasor Project (EIPP).
Keywords :
calibration; measurement standards; phase measurement; power system measurement; synchronisation; Eastern Interconnect Phasor Project; IEEE Standard C37.118-2005; IEEE Standard for synchrophasors for power systems; NIST; National Institute of Standards and Technology; PMU testing guideline; coordinated universal time; dynamic characterization; grid state monitoring; phasor measurement unit; precise time synchronization; static calibration; static electric power signals; synchronized electric power instrumentation; Calibration; Instruments; Measurement standards; NIST; Performance evaluation; Phasor measurement units; Power system dynamics; Power system interconnection; Power systems; System testing; Calibration; Dynamics; Global Positioning System; PMU; Phase measurement; Power system control; Power system measurements; Power system reliability; Synchronization;
Conference_Titel :
Power Engineering Society General Meeting, 2007. IEEE
Conference_Location :
Tampa, FL
Print_ISBN :
1-4244-1296-X
Electronic_ISBN :
1932-5517
DOI :
10.1109/PES.2007.385974