Title :
Can supply current monitoring be applied to the testing of analogue as well as digital portions of mixed ASICs?
Author :
Camplin, D.A. ; Bell, I.M. ; Taylor, G.E. ; Bannister, B.R.
Author_Institution :
Dept. of Electron. Eng., Hull Univ., UK
Abstract :
Investigations are made into the suitability of supply current monitoring as a technique for the testing of analogue circuit modules. Iddq monitoring is already recognised in the digital field. The possibility of a unified testing approach for mixed ASICs is raised. The potential effectiveness of the method is investigated. Simulation results are reported to illustrate typical supply current levels for nominal and defective circuits. Analogue fault detection by this technique is compared with detection by observation of the circuit´s output
Keywords :
automatic testing; circuit analysis computing; mixed analogue-digital integrated circuits; analogue circuit modules; analogue fault detection; defective circuits; mixed ASICs; supply current monitoring; unified testing approach; Automatic test pattern generation; Circuit faults; Circuit testing; Costs; Current supplies; Design for testability; Electrical fault detection; Fault detection; Monitoring; Transient response;
Conference_Titel :
Design Automation, 1992. Proceedings., [3rd] European Conference on
Conference_Location :
Brussels
Print_ISBN :
0-8186-2645-3
DOI :
10.1109/EDAC.1992.205994
