• DocumentCode
    3099715
  • Title

    Discussion Group Summary Report Designing in Reliability - Dir

  • Author

    Poulter, Mark ; Vigrass, William

  • Author_Institution
    National Semiconductor Corporation, CA
  • fYear
    1997
  • fDate
    13-16 Oct. 1997
  • Firstpage
    119
  • Lastpage
    120
  • Keywords
    Drives; Instruments; Manufacturing processes; Packaging; Performance evaluation; Process design; Qualifications; Semiconductor device manufacture; Semiconductor device reliability; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 1997 IEEE International
  • Conference_Location
    Lake Tahoe, CA, USA
  • Print_ISBN
    0-7803-4205-4
  • Type

    conf

  • DOI
    10.1109/IRWS.1997.660298
  • Filename
    660298
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3099715