• DocumentCode
    3099869
  • Title

    Study on a new method for detecting flatness defects of hot rolling strip

  • Author

    Liu, Jiang ; Wang, Chang-Song

  • Author_Institution
    Mech. Eng. Sch., Univ. of Sci. & Technol. Beijing, Beijing, China
  • fYear
    2010
  • fDate
    15-17 June 2010
  • Firstpage
    1891
  • Lastpage
    1896
  • Abstract
    A new non-contact method for detecting the flatness of hot rolling strip, which is based on laser, CCD and digital image processing technology is presented. This new method projects linear lasers to the strip at some angle between 20 degree to 30 degree from the length and width direction of strip to become the latitudinal and longitudinal lines, and then uses one or several cameras to pick images of strip surface containing linear laser lines. The 3D curves are restored from the picked images containing 2D laser lines, and then the 3D surface of strip are built by the restored 3D curves, finally the flatness of strip is obtained based on the 3D surface. The paper explains the measuring principle, the component of system and the implementation in detail. During the implementation, mathematical model and adjustment of camera, system calibration, image processing, restoring 3D curves, surface fitting, and analysis of flatness across the strip width are discussed.
  • Keywords
    CCD image sensors; curve fitting; hot rolling; image restoration; mechanical engineering computing; strips; 3D curves; CCD image processing; camera adjustment; digital image processing; flatness defect detection; hot rolling strip; image restoration; laser image processing; linear laser lines; mathematical model; noncontact method; strip surface; surface fitting; system calibration; Calibration; Cameras; Charge coupled devices; Digital images; Image restoration; Laser modes; Mathematical model; Strips; Surface emitting lasers; Surface fitting; component; detecting; flatness; laser; strip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ICIEA), 2010 the 5th IEEE Conference on
  • Conference_Location
    Taichung
  • Print_ISBN
    978-1-4244-5045-9
  • Electronic_ISBN
    978-1-4244-5046-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2010.5515453
  • Filename
    5515453