• DocumentCode
    3099906
  • Title

    Discussion Group Summary Wafer Level Reliability (WLR)

  • Author

    Messick, Cleston ; Yankee, Sally

  • Author_Institution
    IBM Microelectronics, Essex Junction, VT
  • fYear
    1997
  • fDate
    13-16 Oct. 1997
  • Firstpage
    121
  • Lastpage
    122
  • Keywords
    Electric variables measurement; Electronics industry; Foundries; Microelectronics; Postal services; Reflectivity; Rivers; Semiconductor device reliability; Stress measurement; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 1997 IEEE International
  • Conference_Location
    Lake Tahoe, CA, USA
  • Print_ISBN
    0-7803-4205-4
  • Type

    conf

  • DOI
    10.1109/IRWS.1997.660299
  • Filename
    660299
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3099906