DocumentCode :
3099906
Title :
Discussion Group Summary Wafer Level Reliability (WLR)
Author :
Messick, Cleston ; Yankee, Sally
Author_Institution :
IBM Microelectronics, Essex Junction, VT
fYear :
1997
fDate :
13-16 Oct. 1997
Firstpage :
121
Lastpage :
122
Keywords :
Electric variables measurement; Electronics industry; Foundries; Microelectronics; Postal services; Reflectivity; Rivers; Semiconductor device reliability; Stress measurement; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 1997 IEEE International
Conference_Location :
Lake Tahoe, CA, USA
Print_ISBN :
0-7803-4205-4
Type :
conf
DOI :
10.1109/IRWS.1997.660299
Filename :
660299
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3099906
بازگشت