DocumentCode :
3099932
Title :
CMOS-integrated memristors for neuromorphic architectures
Author :
Wheeler, Dana ; Kim, Kuk-Hwan ; Gaba, Siddharth ; Wang, Eason ; Kim, Sam ; Valles, Irma ; Li, James ; Royter, Yakov ; Cruz-Albrecht, Jose ; Hussain, Tahir ; Lu, Wei ; Srinivasa, Narayan
Author_Institution :
HRL Labs., Malibu, CA, USA
fYear :
2011
fDate :
7-9 Dec. 2011
Firstpage :
1
Lastpage :
2
Abstract :
High-density memristor arrays are integrated on complementary metal-oxide-semiconductor (CMOS) substrates for neuromorphic circuit architectures. Advancing previously-reported work on Ag-filament memristor arrays [1], memristor operation is shown both in conjunction with CMOS multiplexer (MUX) circuits and in a “direct-access” configuration in which cross-bars are directly connected via CMOS interconnects to probe pads. The memristor arrays provide a high-density analog memory technology intended for CMOS-based neuromorphic architectures, Fig. 1 and [2]. Electrical data is shown for cross-bar arrays fabricated at 400-nm pitch with each memristor exhibiting intrinsic rectifying behavior, a beneficial feature for array operation. Forward-reverse-bias current ratios exceed 103 at ±1.5 V. Devices are programmed to four distinct resistance states, demonstrating utility as an analog memory with an effective number of bits (ENOB) of 2. Devices are fabricated and characterized across a 2” 180-nm-node CMOS wafer. Fabrication results are shown for 100-nm-pitch cross-bar arrays which enable effective bit densities greater than 1010 bits/cm2.
Keywords :
CMOS analogue integrated circuits; analogue storage; electric resistance; integrated circuit interconnections; memristors; multiplexing equipment; rectifying circuits; Ag-filament memristor array; CMOS interconnect; CMOS multiplexer circuit; CMOS wafer; CMOS-integrated memristor; complementary metal-oxide-semiconductor substrate; cross-bar array; direct-access configuration; electrical data; forward-reverse-bias current ratio; high-density analog memory technology; high-density memristor array; intrinsic rectifying behavior; neuromorphic circuit architecture; probe pad; size 100 nm; size 180 nm; size 400 nm; Analog memory; CMOS integrated circuits; Electrodes; Memristors; Neuromorphics; Silicon; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4577-1755-0
Type :
conf
DOI :
10.1109/ISDRS.2011.6135279
Filename :
6135279
Link To Document :
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