Title :
Chip-scale sonic communication using AlN transducers
Author :
Hoople, Jason ; kuo, jay ; Ardanuc, Serhan ; Lal, Amit
Author_Institution :
SonicMEMS Lab., Cornell Univ., Ithaca, NY, USA
Abstract :
On-chip wired interconnects presents a bottleneck for VLSI integrated circuits. An additional channel with which to communicate information would be beneficial to supplement traditional wired designs. Utilizing virtual, reconfigurable ultrasonic interconnects operating at high bit rate could open new vistas for computer architecture and low power computing. The first step to this goal has been demonstrated in this paper by using ultrasonic pulses to communicate between two aluminum nitride thin film transducers on a silicon wafer representative of a VLSI substrate. Direct output voltages on receive pixels were on the order of 40-60 μVpp for a drive voltage on transmit pixels of 0.5 Vpp at 900 MHz. An FEA model was used to verify the time-of-flight and signal amplitudes to demonstrate that the primary mechanism is bulk acoustic waves travelling through the silicon substrate.
Keywords :
VLSI; acoustic waves; aluminium compounds; finite element analysis; integrated circuit design; integrated circuit interconnections; low-power electronics; microprocessor chips; ultrasonic transducers; AlN; FEA model; Si; VLSI integrated circuits; VLSI substrate; acoustic waves; aluminum nitride; bit rate; chip-scale sonic communication; frequency 900 MHz; low power computing; on-chip wired interconnects; reconfigurable ultrasonic interconnects; signal amplitudes; silicon substrate; silicon wafer representative; thin film transducers; time-of-flight amplitudes; ultrasonic pulses; virtual ultrasonic interconnects; wired designs; Acoustics; CMOS integrated circuits; III-V semiconductor materials; Radio frequency; Silicon; Transducers; Transmission line measurements; AlN; MEMS; SONAR; communication;
Conference_Titel :
Ultrasonics Symposium (IUS), 2013 IEEE International
Conference_Location :
Prague
Print_ISBN :
978-1-4673-5684-8
DOI :
10.1109/ULTSYM.2013.0493