DocumentCode

3100319

Title

Discussion Group Summary Reliability Test Structures

Author

Turner, Timothy

Author_Institution

Keithley Instruments, Cleveland, OH

fYear

1997

fDate

13-16 Oct. 1997

Firstpage

125

Lastpage

125

Keywords

Circuit testing; Electromigration; Failure analysis; Instruments; Monitoring; Process control; Production; Qualifications; Random access memory; Size control;

fLanguage

English

Publisher

ieee

Conference_Titel

Integrated Reliability Workshop Final Report, 1997 IEEE International

Conference_Location

Lake Tahoe, CA, USA

Print_ISBN

0-7803-4205-4

Type

conf

DOI

10.1109/IRWS.1997.660301

Filename

660301