DocumentCode :
3100542
Title :
Photosensitivity analysis of n-ZnO/p-SiC heterojunction structures
Author :
Jung, Ji-Chul ; Kang, Min-Seok ; Kim, Ji-Hong ; Lee, Jin-Woo ; Moon, Byung-Moo ; Koo, Sang-Mo
Author_Institution :
Sch. of Electron. & Inf., Kwangwoon Univ., Seoul, South Korea
fYear :
2011
fDate :
7-9 Dec. 2011
Firstpage :
1
Lastpage :
2
Abstract :
Among the wide band gap semiconductor materials that have drawn a lot of attention recently, ZnO and SiC are seriously considered as materials for emerging electronics applications. ZnO has received attention for its application for UV light-emitters, transparent high power electronics, sensors, piezo electric transducers, and solar cells, because of its high chemical stability, non-toxicity, low cost and high optical band gap of ~3.37 eV. 4H-SiC has very a small lattice mismatch to ZnO (~5%), a wide band gap (~3.2 eV) with excellent thermal properties, and thus suitable for applications such as optoelectronic, high-power, high-frequency, and high-temperature devices. In addition, its useful properties include the existence of the availability of large area substrate, and a high electron saturation velocity.
Keywords :
Auger electron spectra; II-VI semiconductors; annealing; electron beam deposition; infrared spectra; pulsed laser deposition; semiconductor growth; semiconductor heterojunctions; semiconductor thin films; silicon compounds; ultraviolet spectra; vacuum deposition; visible spectra; wide band gap semiconductors; zinc compounds; ZnO-SiC; size 200 nm; temperature 200 degC; temperature 400 degC; temperature 600 degC; Heterojunctions; Optical sensors; Resistance; Semiconductor diodes; Silicon carbide; Substrates; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4577-1755-0
Type :
conf
DOI :
10.1109/ISDRS.2011.6135312
Filename :
6135312
Link To Document :
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