DocumentCode
3100555
Title
Comparative study of online testing methods for AMS application to decimation filters
Author
Naal, M.A. ; Simeu, E. ; Mir, S.
Author_Institution
Dept. of Comput. Eng., Univ. of Aleppo, Syria
fYear
2004
fDate
19-23 April 2004
Firstpage
393
Lastpage
394
Abstract
This paper presents the comparative study of on-line testing methods for AMS systems application to decimation filters. We present a case-study implementation of high-level-synthesis-for-testability (HLSFT) methodology for the case of a decimation filter implemented in a BIST circuitry for mixed-signal core testing. Three different self-test techniques are studied and compared for a 0.6, 0.35 and 0.18 μm CMOS technologies.
Keywords
CMOS integrated circuits; FIR filters; IIR filters; automatic testing; built-in self test; comb filters; integrated circuit testing; AMS system; BIST circuitry; CMOS technology; HLSFT; analog-mixed-signal core testing; decimation filter; high-level-synthesis-for-testability; on-line testing method; Application software; Built-in self-test; CMOS technology; Circuit faults; Circuit synthesis; Circuit testing; Delay; Filters; System testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Information and Communication Technologies: From Theory to Applications, 2004. Proceedings. 2004 International Conference on
Print_ISBN
0-7803-8482-2
Type
conf
DOI
10.1109/ICTTA.2004.1307797
Filename
1307797
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