Study on equivalent single conductor model of multi-walled carbon nanotube interconnects

Author

Min Tang ; Jiaqing Lu ; Junfa Mao

Author_Institution

Key Lab. of Minist. of Educ. of China for Res. of Design & Electromagn. Compatibility of High Speed Electron. Syst., Shanghai Jiao Tong Univ., Shanghai, China

fYear

2012

fDate

4-7 Dec. 2012

Firstpage

1247

Lastpage

1249

Abstract

The equivalent single conductor (ESC) model provides an efficient way for transient simulation of complex multi-walled carbon nanotube (MWCNT) interconnects. In this paper, the validity and accuracy of the ESC model of MWCNT are investigated when the impacts of intershell tunneling conductance and imperfect contact resistance are considered. Both the voltage distribution and terminal response are compared with the multiconductor circuit (MCC) model. Some discussions based on the numerical results of single and coupled MWCNT interconnects are given.

Keywords

carbon nanotubes; contact resistance; equivalent circuits; integrated circuit interconnections; ESC model; equivalent single conductor model; imperfect contact resistance; intershell tunneling conductance; multiconductor circuit model; multiwalled carbon nanotube interconnects; terminal response; transient simulation; voltage distribution; Carbon nanotubes; Contact resistance; Integrated circuit interconnections; Integrated circuit modeling; Numerical models; Transient analysis; Tunneling; Multi-walled carbon nanotubes; equivalent single conductor model; interconnects; transient simulation;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference Proceedings (APMC), 2012 Asia-Pacific

Conference_Location

Kaohsiung

Print_ISBN

978-1-4577-1330-9

Electronic_ISBN

978-1-4577-1331-6

Type

conf

DOI

10.1109/APMC.2012.6421884

Filename

6421884