• DocumentCode
    3100814
  • Title

    Polarization enhanced tunnel junctions in tandem solar cells

  • Author

    Zhou, Shuai ; Tompkins, Randy P. ; Jones, Kenneth A. ; Gallinat, Chad ; Rotella, Paul, Jr. ; Moe, Craig ; Wraback, Michael

  • Author_Institution
    Sensors & Electron Devices Directorate, U.S. Army Res. Lab., Adelphi, MD, USA
  • fYear
    2011
  • fDate
    7-9 Dec. 2011
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    By utilizing the spontaneous and piezoelectric polarization inherent in wurtzite III-V nitride semiconductors, the insertion of a strained layer of InGaN, AlN or InN along the [0001] crystal orientation of GaN will result in large sheets of fixed charges. The permanent dipole resulting from these charges contribute directly to the high electric field in these layers that bends the conduction band on the n-side below the valence band of the p-side to enable interband (Zener) tunneling. At low reverse bias, this tunneling current can achieve higher magnitudes than its equally biased forward regime. This is essentially backward conduction, which is useful mechanism in providing a low resistance pathway for current in tandem solar cells.
  • Keywords
    III-V semiconductors; polarisation; solar cells; tunnelling; AlN; InGaN; TEM; interband tunneling; piezoelectric polarization; polarization enhanced tunnel junctions; tandem solar cells; temperature 700 C; transmission electron microscopy; wurtzite III-V nitride semiconductors; Current density; Distance measurement; Gallium nitride; Junctions; Nickel; Photovoltaic cells; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium (ISDRS), 2011 International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4577-1755-0
  • Type

    conf

  • DOI
    10.1109/ISDRS.2011.6135325
  • Filename
    6135325