Comparison tests of high current shunts in high power laboratories in Asia with an STL reference shunt

Author

Goda, Yutaka ; Kim, Maeng Hyun ; Wang, An ; Sengupta, Gautam

Author_Institution

Central Res. Inst. of Electr. Power Ind. (CRIEPI), Yokosuka, Japan

fYear

2012

fDate

7-10 May 2012

Firstpage

1

Lastpage

8

Abstract

To establish traceability for high current measurements, comparison tests of high current shunts in high power laboratories have been carried out with STL reference shunts since 2005. In this paper, we describe the comparison test results of shunts in high power laboratories in Asia. Test results showed the shunts tested for the comparison tests performed well and most of the differences of the scale factor with the power frequency current between the reference shunt and those tested in participating laboratories were less than 0.5%.

Keywords

electric current measurement; laboratories; short-circuit currents; test equipment; Asia; STL reference shunt; high current measurements; high current shunt testing; high power laboratories; power frequency current; short-circuit testing liaison; Asia; Current measurement; Europe; Interference; Laboratories; Linearity; Temperature measurement; High-current; STL; high-power testing; measurement; shunt;

fLanguage

English

Publisher

ieee

Conference_Titel

Transmission and Distribution Conference and Exposition (T&D), 2012 IEEE PES

Conference_Location

Orlando, FL

ISSN

2160-8555

Print_ISBN

978-1-4673-1934-8

Electronic_ISBN

2160-8555

Type

conf

DOI

10.1109/TDC.2012.6281439

Filename

6281439