Title :
Comparison tests of high current shunts in high power laboratories in Asia with an STL reference shunt
Author :
Goda, Yutaka ; Kim, Maeng Hyun ; Wang, An ; Sengupta, Gautam
Author_Institution :
Central Res. Inst. of Electr. Power Ind. (CRIEPI), Yokosuka, Japan
Abstract :
To establish traceability for high current measurements, comparison tests of high current shunts in high power laboratories have been carried out with STL reference shunts since 2005. In this paper, we describe the comparison test results of shunts in high power laboratories in Asia. Test results showed the shunts tested for the comparison tests performed well and most of the differences of the scale factor with the power frequency current between the reference shunt and those tested in participating laboratories were less than 0.5%.
Keywords :
electric current measurement; laboratories; short-circuit currents; test equipment; Asia; STL reference shunt; high current measurements; high current shunt testing; high power laboratories; power frequency current; short-circuit testing liaison; Asia; Current measurement; Europe; Interference; Laboratories; Linearity; Temperature measurement; High-current; STL; high-power testing; measurement; shunt;
Conference_Titel :
Transmission and Distribution Conference and Exposition (T&D), 2012 IEEE PES
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-1934-8
Electronic_ISBN :
2160-8555
DOI :
10.1109/TDC.2012.6281439