• DocumentCode
    3101753
  • Title

    Do you really know the thermal conductivity of your boards?

  • Author

    Esmailpour, Mohsen

  • Author_Institution
    UCLA Sch. of Mech. Eng., Teradyne Inc., Agoura Hills, CA
  • fYear
    2009
  • fDate
    15-19 March 2009
  • Firstpage
    55
  • Lastpage
    64
  • Abstract
    Thermal engineers, tasked with ensuring reliable operating temperature of devices, routinely have to estimate or more likely guesstimate the bulk thermal conductivity of the board using the limited industry-published data or resort to outdated and unproven closed form correlations for use in simulation tools. This can have an adverse effect on the projected operating temperature of sensitive devices, the accuracy and eventually the reliability. As a first reported attempt at Teradyne and perhaps in industry, a custom measurement instrument has been developed and is used for measuring the effective thermal conductivity of a large variety of test board constructions with various package land patterns, via density, via-fill, and dielectric material which match closely the production boards´ construction. The instrument has been calibrated using prepared materials of known or measured conductivity which include Lexan, Pyrex, S. Steel and Brass alloy. To account for the difference and changes in various board designs over time, a commercial thermal software tool, capable of importing the ECAD/Allegro data base electronically, has been acquired for simulation and the projections are compared with the collected measurements. This paper will describe the challenges and the findings as a mean to inform and equip thermal engineers in their quest for a more reliable design and faster to market product introduction.
  • Keywords
    ball grid arrays; printed circuits; thermal conductivity; FBGA; Lexan; PCB; Pyrex; brass alloy; dielectric materials; package land patterns; printed circuit board; solder; thermal conductivity; vias; Conductivity measurement; Data engineering; Density measurement; Dielectric materials; Dielectric measurements; Instruments; Reliability engineering; Temperature sensors; Thermal conductivity; Thermal engineering; ECAD; PCB; Thermal conductivity; Vias; dielectric; land pattern;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2009. SEMI-THERM 2009. 25th Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4244-3664-4
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2009.4810743
  • Filename
    4810743