• DocumentCode
    3101897
  • Title

    Frictional and collector pressure losses in rectangular microchannels

  • Author

    Saenen, Tom ; Persoons, Tim ; Peirs, Jan ; Baelmans, Martine

  • Author_Institution
    Dept. of Mech. Eng., Katholieke Univ. Leuven, Heverlee
  • fYear
    2009
  • fDate
    15-19 March 2009
  • Firstpage
    121
  • Lastpage
    127
  • Abstract
    In this paper a new measurement method is developed to determine the friction factors in microchannels. Based on a set of experiments at variable microchannel lengths the friction factor can be derived by least-squares fitting well-established pressure loss correlations. Furthermore, collector losses and developing flow regime can be identified. An experimental set-up is build to demonstrate this method. It is found that the friction factors obtained with the new method correspond very well with the values obtained from conventional correlations. However the measurements also show a significantly lower critical Reynolds number (1400-1800) than the conventional value for channel flow. However the Obot-Jones model combined with the empirical correlations of Samoilenko do predict the critical Reynolds number well. For the collector losses the obtained values have a large spread but tend to values lower than the values obtained by conventional correlations. These losses also show a dependence on Reynolds number in the laminar regime which is not retrieved in macro scale correlations.
  • Keywords
    heat sinks; least squares approximations; microchannel flow; Obot-Jones model; Reynolds number; channel flow; collector pressure losses; contraction losses; electronics cooling; frictional losses; least-squares; microchannel heat sinks; rectangular microchannels; Electronics cooling; Fluid flow measurement; Friction; Length measurement; Loss measurement; Mechanical engineering; Microchannel; Pressure measurement; Temperature; Water heating; Contraction losses; Expansion losses; Frictional pressure losses; Microchannels; Single-phase;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2009. SEMI-THERM 2009. 25th Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4244-3664-4
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2009.4810752
  • Filename
    4810752