DocumentCode
3102003
Title
Automatic confidence measure extraction for SVM outputs using neural network
Author
Amini, S. ; Razzazi, F. ; Nayebi, K.
Author_Institution
Electr. Eng. Dept., Islamic Azad Univ., Tehran
fYear
2008
fDate
27-28 Aug. 2008
Firstpage
602
Lastpage
607
Abstract
In this paper, a trainable confidence measuring system has been proposed and tested on speech recognition systems based on SVM classifiers. Classically, most of speech recognition methods have been established on the basis of probability models and statistical density estimation of each language unit and the confidence measure (CM) is extracted implicitly as a byproduct of the process of classification. Although support vector machines have shown their potential in optimizing the recognition rate, an appropriate CM has not been proposed for this purpose. This paper describes two methods to add CM into the SVM outputs using trainable intelligent systems. The first method is the simulation of Platt method using neural network and the second method is a linear combination of Platt sigmoid function using multi-layer perceptron. The experiments of these methods have been arranged on the dialects of TIMIT corpus. The results of these experiments show that the second method demonstrates better performance than the first one. e.g. After rejecting 20% of classifications by CM, the achieved error rates for ldquo/b/,/d/rdquo , ldquo/b/,/g/rdquo and ldquo/d/,g/rdquo phonemes are 6%, 3.5% and 2% respectively, while this error rate is much higher without employing neural networks. Although by increasing the number of phonemes, the performance of the second method will match that of the first method.
Keywords
radial basis function networks; speech recognition; support vector machines; Platt method; SVM outputs; automatic confidence measure extraction; neural network; speech recognition systems; support vector machines; Density measurement; Error analysis; Intelligent systems; Natural languages; Neural networks; Probability; Speech recognition; Support vector machine classification; Support vector machines; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Telecommunications, 2008. IST 2008. International Symposium on
Conference_Location
Tehran
Print_ISBN
978-1-4244-2750-5
Electronic_ISBN
978-1-4244-2751-2
Type
conf
DOI
10.1109/ISTEL.2008.4651372
Filename
4651372
Link To Document