DocumentCode :
3102050
Title :
Measurement and computation of transient recovery voltage of transformer limited fault in 525kV–1500MVA three-phase transformer
Author :
Kagawa, H. ; Maekawa, T. ; Yamagata, Y. ; Nishiwaki, S. ; Chigiri, T. ; Saida, T. ; Hosokawa, O.
Author_Institution :
Tokyo Electr. Power Co., Tokyo, Japan
fYear :
2012
fDate :
7-10 May 2012
Firstpage :
1
Lastpage :
7
Abstract :
Transient recovery voltage (TRV) in a 525kV-1500 MVA transformer of the three-phase-in-one-tank type was measured. It was proved that TRV can be measured by interrupting the current generated by discharging a capacitor of low voltage through the transformer. The current was interrupted at its zero point by a semiconductor diode at a low voltage. To compute the TRV, a transformer equivalent model composed of an L-C multi-mesh circuit was developed. The TRV waveform computed using the transformer equivalent model agreed well with the measured TRV waveform. The difference among the TRV of the first, second and third pole interruption was explained by the computation with the circuits of symmetrical component method. The transformer inductance that determines the TRV did not have frequency dependency up to the rage of about 20 kHz of the TRV frequency.
Keywords :
fault diagnosis; potential transformers; power capacitors; power transformers; semiconductor diodes; L-C multimesh circuit; TRV waveform; apparent power 1500 MVA; capacitor; semiconductor diode; symmetrical component method; third pole interruption; three-phase-in-one-tank type transformer; transformer equivalent model; transformer inductance; transformer limited fault; transient recovery voltage of transformer; voltage 525 kV; Computational modeling; Current measurement; Impedance; Integrated circuit modeling; Interrupters; Transient analysis; Voltage measurement; transformer equivalent model; transformer limited fault; transient recovery voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transmission and Distribution Conference and Exposition (T&D), 2012 IEEE PES
Conference_Location :
Orlando, FL
ISSN :
2160-8555
Print_ISBN :
978-1-4673-1934-8
Electronic_ISBN :
2160-8555
Type :
conf
DOI :
10.1109/TDC.2012.6281463
Filename :
6281463
Link To Document :
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