• DocumentCode
    3102127
  • Title

    Fault diagnosis using cascade H∞ observers with application to spacecraft attitude control

  • Author

    Wang, Yulei ; Ma, Guangfu ; Li, Chuanjiang

  • Author_Institution
    Dept. of Control Sci. & Eng., Harbin Inst. of Technol., Harbin, China
  • fYear
    2010
  • fDate
    15-17 June 2010
  • Firstpage
    1976
  • Lastpage
    1981
  • Abstract
    This paper proposes a gyro and star sensor fault diagnosis architecture that designs two groups of cascade H∞ optimal fault observers using LMI for spacecraft attitude control systems and schemes a Compensation PD controller to achieve fault tolerant control. The basic idea of the approach is to identify the gyro fault to good effect first and then makes a further diagnosis for the star sensor based on the former. The H∞ optimal fault observers in design have the robustness with respect to model uncertainties, disturbance and diagnosis uncertainties. The Compensation PD controller ensures the attitude error maintains to a small set around the equilibrium point even though the gyro and star sensor faults occur simultaneously. Simulation results demonstrate the effectiveness and feasibility of the proposed control algorithm.
  • Keywords
    H∞ control; PD control; attitude control; cascade control; control system synthesis; fault diagnosis; linear matrix inequalities; observers; sensors; space vehicles; uncertain systems; LMI; cascade H∞ optimal fault observers; compensation PD controller; diagnosis uncertainties; fault tolerant control; gyro fault diagnosis architecture; model uncertainties; spacecraft attitude control system; star sensor fault diagnosis architecture; Attitude control; Control systems; Fault diagnosis; Fault tolerant systems; Optimal control; PD control; Robustness; Sensor systems; Space vehicles; Uncertainty; Fault diagnosis; Fault tolerant control; H∞ optimal fault observer; Spacecraft attitude control systems; cascade observer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ICIEA), 2010 the 5th IEEE Conference on
  • Conference_Location
    Taichung
  • Print_ISBN
    978-1-4244-5045-9
  • Electronic_ISBN
    978-1-4244-5046-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2010.5515561
  • Filename
    5515561