DocumentCode :
3102313
Title :
An automatic calibration circuit for 12-bits single-ramp A-to-D converter in LHC environments
Author :
Vergine, Tommaso ; De Matteis, M. ; Rota, L. ; Marchioro, A. ; Baschirotto, A.
Author_Institution :
Univ. of Milano Bicocca, Milan, Italy
fYear :
2013
fDate :
24-27 June 2013
Firstpage :
45
Lastpage :
48
Abstract :
A calibration circuit for single-ramp A-to-D converters is presented here. The calibration circuit allows to automatically compensate the process/mismatch and radiation effects on the A-to-D converter, improving performance and Equivalent Number of Bits. In particular, the calibration circuit is able to automatically align the ramp signal reference used for the conversion in single slope architectures A-to-D architectures, compensating slope deviations due to technological/electrical reasons. Moreover, the calibration circuit shares the same analog circuits of the A-to-D converter, requiring only a small additional power budget and logic for the implementation. The calibration circuit has been validated, testing the overall A-to-D converter after the calibration. A 12 steps binary search is required to calibrate the A-to-D converter (about 2.5ms). This calibration circuit is able to guarantee an 11bits accuracy, in the worst case simulation corner. The technology used is a 65 nm CMOS. The clock frequency has been set to 20 MHz and the power consumption is about 400 μW.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; compensation; integrated circuit measurement; integrated circuit testing; radiation hardening (electronics); radiofrequency integrated circuits; ramp generators; CMOS technology; LHC environment; analog circuit; automatic calibration circuit; binary search; clock frequency; frequency 20 MHz; power consumption; process-mismatch compensation; radiation effect; ramp generator; ramp signal reference; single slope architecture; single-ramp A-to-D converter; size 65 nm; technological-electrical reason; word length 11 bit; word length 12 bit; Arrays; CMOS integrated circuits; Calibration; Capacitors; Large Hadron Collider; Mirrors; Quantization (signal); A-to-D; Automatic Calibration; High-Energy-Physics instrumentation; Low-Power; Radiation Hardness; Successive Approximations Register;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ph.D. Research in Microelectronics and Electronics (PRIME), 2013 9th Conference on
Conference_Location :
Villach
Print_ISBN :
978-1-4673-4580-4
Type :
conf
DOI :
10.1109/PRIME.2013.6603108
Filename :
6603108
Link To Document :
بازگشت