DocumentCode :
3102474
Title :
Flow-induced spatial non-uniformity and anisotropy in electrically conductive adhesives
Author :
Smith, Brian ; Bonetti, Alexander ; Gnos, Tobias ; Michel, Bruno
Author_Institution :
Zurich Res. Lab., IBM Res. GmbH, Ruschlikon
fYear :
2009
fDate :
15-19 March 2009
Firstpage :
304
Lastpage :
308
Abstract :
Electrically conductive adhesives (ECA) are popular solutions for joining relatively large (> 500 mum) electrical interfaces or when lower-temperature requirements preclude soldering or brazing. When assembled by squeezing between two flat, rectangular surfaces, the flow dynamics of the conductive filler and matrix can induce variations in local electrical conductance. This becomes significant as the area of the interface (bond pad) becomes comparable to the bondline thickness (BLT) of the adhesive. We observe order-of-magnitude local variations in electrical conductance and strong anisotropy in the direction of flow in ECAs with silver (Ag) flakes. We discuss the influence of these electrical results on heat diffusion across the interface and consider how fabricating microchannels in the interface could reduce the non-uniformities. Both electrical and thermal aspects are analyzed in light of ever-shrinking dimensions and 3-D stacking trends in thermally-critical electronics packages.
Keywords :
adhesives; electronics packaging; microchannel flow; 3D stacking; bondline thickness; brazing; conductive filler; electrical interfaces; electrically conductive adhesives; flow dynamics; flow-induced spatial nonuniformity; order-of-magnitude local variations; rectangular surfaces; soldering; squeezing; thermally-critical electronics packages; Anisotropic magnetoresistance; Assembly; Bonding; Conductive adhesives; Electronic packaging thermal management; Microchannel; Resistance heating; Silver; Soldering; Stacking; Conductive adhesive; anisotropic conductivity; electronics packaging; hierarchically nested channels;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2009. SEMI-THERM 2009. 25th Annual IEEE
Conference_Location :
San Jose, CA
ISSN :
1065-2221
Print_ISBN :
978-1-4244-3664-4
Electronic_ISBN :
1065-2221
Type :
conf
DOI :
10.1109/STHERM.2009.4810780
Filename :
4810780
Link To Document :
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