Title :
Steganalysis of LSB-Matching steganography by removing most significant bit planes
Author :
Mehrabi, M.A. ; Aghaeinia, H. ; Abolghasemi, M.
Author_Institution :
Electr. Eng. Dept., Amirkabir Univ. of Technol., Tehran
Abstract :
This paper proposed a new steganalysis scheme of LSB-matching steganography based on statistical moments of the DFT of histogram of multi-level wavelet subbands. Before deriving these wavelet subbands a pre-processing apply to images under the test. The pre-processing contains removing some most significant bit planes. Then we decompose the image using three-level Haar discrete wavelet transform (DWT) into 13 subbands (here the image itself is considered as the LL0 subband).The Fourier transform of each subband histogram, is calculated. Then it is divided into low and high frequency bands. The first three statistical moments of each band are selected to form a 78-dimensional feature vector for Steganalysis. Support vector machines (SVM) classifier is then used to discriminate between stego-images and innocent images.
Keywords :
Haar transforms; discrete Fourier transforms; discrete wavelet transforms; image classification; image coding; image matching; statistical analysis; steganography; support vector machines; DFT histogram; Haar discrete wavelet transform; LSB-matching steganography; SVM classifier; discrete Fourier transform; image decomposition; image preprocessing; significant bit planes; statistical moments; steganalysis scheme; support vector machine; three-level DWT; Art; Digital images; Discrete Fourier transforms; Discrete wavelet transforms; Fourier transforms; Histograms; Internet; Steganography; Support vector machine classification; Support vector machines; Histogram; LSB-Matching; Steganalysis; Steganography; Support Vector Machines (SVM) classifier is then; Wavelet; innocent images.; used to discriminate between stego-images and;
Conference_Titel :
Telecommunications, 2008. IST 2008. International Symposium on
Conference_Location :
Tehran
Print_ISBN :
978-1-4244-2750-5
Electronic_ISBN :
978-1-4244-2751-2
DOI :
10.1109/ISTEL.2008.4651396