DocumentCode :
3102634
Title :
Current sensing techniques for global interconnects in very deep submicron (VDSM) CMOS
Author :
Maheshwari, Atul ; Burleson, Wayne
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
fYear :
2001
fDate :
37012
Firstpage :
66
Lastpage :
70
Abstract :
Sensing current instead of voltage provides an alternative to signaling on the long wires that are increasingly limiting the performance of CMOS as it scales into the VDSM regime (<0.25 μ). Current-mode techniques have been proposed for sensing bit-lines. We present a comparative study of Current-sensing with the optimal repeater insertion technique for wires from 0.35 cm to 1.75 cm in length. Simulation results using SPICE for 0.18 μ showed that current-sensing was faster and lower-power when compared to optimal repeater insertion technique. While the power dissipated by the optimal repeater circuit increased linearly with line length, power dissipated by the current-sensing circuit was almost constant for longer lines. Inductance had little effect on the differential current sensing technique
Keywords :
CMOS integrated circuits; SPICE; VLSI; circuit simulation; current-mode circuits; integrated circuit interconnections; low-power electronics; 0.18 micron; 0.35 to 1.75 cm; SPICE; current sensing techniques; current-mode techniques; global interconnects; line length; optimal repeater insertion technique; very deep submicron CMOS; CMOS integrated circuits; Circuit simulation; Delay; Driver circuits; Inductance; Integrated circuit interconnections; Repeaters; SPICE; Threshold voltage; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI, 2001. Proceedings. IEEE Computer Society Workshop on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7695-1056-6
Type :
conf
DOI :
10.1109/IWV.2001.923141
Filename :
923141
Link To Document :
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