DocumentCode :
3102769
Title :
Capacitive out of plane large stroke MEMS structure
Author :
Glacer, Christoph ; Laur, Rainer ; Dehe, A. ; Tumpold, David
Author_Institution :
Inst. for Electromagn. Theor. & Microelectron. (ITEM), Univ. of Bremen, Bremen, Germany
fYear :
2013
fDate :
24-27 June 2013
Firstpage :
125
Lastpage :
128
Abstract :
This paper introduces a way to increase the airgap of a capacitive MEMS sensor or actuator. Usually, a thicker sacrificial layer composed of silicon dioxide is used to increase the distance between two parallel plates. In our case, both poly-silicon planes are being produced with a small gap filled with silicon dioxide. Corrugation grooves lined with highly tensile silicon nitride cause a stress induced displacement of the stator after the release etch was done. We will present first results, gained from FEM-simulations and fabricated wafers. An insight into the optimization of the deflection profile and the mechanical stability of the buckling electrode is discussed.
Keywords :
actuators; capacitive sensors; mechanical stability; microsensors; silicon compounds; FEM-simulations; SiNi; SiO2; airgap; buckling electrode; capacitive actuator; capacitive out of plane large stroke MEMS structure; capacitive sensor; corrugation grooves; deflection profile; fabricated wafers; mechanical stability; microelectromechanical systems; parallel plates; polysilicon planes; sacrificial layer; stress induced displacement; Capacitance; Layout; Micromechanical devices; Silicon; Silicon compounds; Stability analysis; Stators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ph.D. Research in Microelectronics and Electronics (PRIME), 2013 9th Conference on
Conference_Location :
Villach
Print_ISBN :
978-1-4673-4580-4
Type :
conf
DOI :
10.1109/PRIME.2013.6603131
Filename :
6603131
Link To Document :
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