Transient fault sensitivity analysis of analog-to-digital converters (ADCs)

Author

Singh, Mandeep ; Rachala, Ravinder ; Koren, Israel

Author_Institution

Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA

fYear

2001

fDate

37012

Firstpage

140

Lastpage

145

Abstract

Reliability of systems used in space, avionic and biomedical applications is highly critical. Such systems consist of an analog front-end to collect data, an ADC to convert the collected data to digital form and a digital unit to process it. It is important to analyze the fault sensitivities of each of these to effectively gauge and improve the reliability of the system. This paper addresses the issue of fault sensitivity of ADCs. A generic methodology for analyzing the fault sensitivity of ADCs is presented. A novel concept of “node weights” specific to α-particle induced transient faults is introduced to increase the accuracy of such an analysis

Keywords

alpha-particle effects; analogue-digital conversion; fault diagnosis; integrated circuit reliability; monolithic integrated circuits; sensitivity analysis; transient analysis; α-particle induced transient faults; ADC sensitivity; alpha particle induced faults; analog-to-digital converters; generic methodology; node weights; transient fault sensitivity analysis; Aerospace electronics; Analog-digital conversion; Application software; Circuit faults; Circuit testing; Fabrication; Fault diagnosis; Fault tolerance; Sensitivity analysis; Transient analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI, 2001. Proceedings. IEEE Computer Society Workshop on

Conference_Location

Orlando, FL

Print_ISBN

0-7695-1056-6

Type

conf

DOI

10.1109/IWV.2001.923153

Filename

923153