Transient Fault Representativenesses Comparison Analysis

As semiconductor technology scales into deep submicron regime, transient fault vulnerability of both combinational logic and sequential logic increase rapidly. It is predicted that in 2011 transient fault rate of combinational logic will overtake that of sequential logic in processor. In this paper, particle radiation-induced multi-bit transient faults in decoder unit, representative combinational logic components in SPARC processor, are simulated under different fault injection method, namely simulation-based fault injection and compilation supported static fault injection respectively. Fault representativenesses observed in both fault injection experiments are analyzed, and the inaccuracy factors of the static error injection method are put forward.