DocumentCode
310333
Title
Experimental test of a charge conserving macromodel for MOSFETs
Author
Kim, Joon-Yub ; Geiger, Randall L.
Author_Institution
Texas Instrum. Inc., Dallas, TX, USA
Volume
1
fYear
1996
fDate
18-21 Aug 1996
Firstpage
47
Abstract
A charge conserving macromodel convenient to use and effective for the simulation of the charge injection behavior of MOSFET switches has been presented. The macromodel is compared with the SPICE level 2 charge conserving model. The accuracy of the macromodel is tested by measuring the clock-feed-through error of a simple sample-and-hold circuit. The macromodel is accurate even at high switching speed because of its distributed nature and because of its ability to simulate the leakage current to the bulk
Keywords
MOSFET; field effect transistor switches; leakage currents; sample and hold circuits; semiconductor device models; MOSFET switches; charge conserving macromodel; charge injection behavior; clock-feed-through error; leakage current; sample-and-hold circuit; switching speed; Capacitance; Circuit simulation; Circuit testing; Clocks; Instruments; MOSFETs; SPICE; Switches; Switching circuits; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1996., IEEE 39th Midwest symposium on
Conference_Location
Ames, IA
Print_ISBN
0-7803-3636-4
Type
conf
DOI
10.1109/MWSCAS.1996.594024
Filename
594024
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