DocumentCode
3103677
Title
Analysis of incident light angles on nano-grating structure for minimizing reflection losses in GaAs solar cells
Author
Das, Niladri ; Charoenpitaks, Korawat ; Islam, Shariful
Author_Institution
Dept. of Electr. & Comput. Eng., Curtin Univ., Perth, WA, Australia
fYear
2013
fDate
Sept. 29 2013-Oct. 3 2013
Firstpage
1
Lastpage
6
Abstract
Subwavelength grating (SWG) structures make an excellent alternative antireflective (AR) coating due to its capacity to reduce the reflection losses in GaAs solar cells. The SWG structures allow the gradual change in refractive index that confirms an excellent AR coating and the light trapping properties when compare with planar thin film structures. Finite-difference time domain (FDTD) method is used to simulate the reflection losses of the SWG structure in GaAs solar cells. The FDTD simulation results show that the slightly change of incident angle affect the reflection losses of all nano-grating structure. The simulation results also confirmed that the reflection loss of nano-grating structure maintained optimum within ~±5° of incident angle tolerance for the grating height over 300-nm for minimizing the reflection losses in GaAs solar cells.
Keywords
antireflection coatings; finite difference time-domain analysis; gallium arsenide; solar cells; AR coating; FDTD method; GaAs solar cells; SWG structures; alternative antireflective coating; finite-difference time domain method; incident angle; light trapping properties; nanograting structure; planar thin film structures; reflection losses; subwavelength grating structures; Equations; Indexes; Mathematical model; Surface treatment; Surface waves; FDTD simulation; incident angle; nano-structures; reflection losses; solar cells; subwavelength grating (SWG); triangular or conical shaped nano-grating;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Engineering Conference (AUPEC), 2013 Australasian Universities
Conference_Location
Hobart, TAS
Type
conf
DOI
10.1109/AUPEC.2013.6725384
Filename
6725384
Link To Document