• DocumentCode
    31040
  • Title

    Aging Tests of the High Current Aluminum–Copper Contact Connections in the ITER DC Busbar System

  • Author

    Koktsinskaya, Elena Mihaylovna ; Roshal, Alexandr Grigorievich ; Karpishin, Valery Myhaylovich ; Prosvirnin, Vladimir Georgievich

  • Author_Institution
    D.V. Efremov Sci. Res. Inst. of Electrophys. Apparatus, St. Petersburg, Russia
  • Volume
    42
  • Issue
    3
  • fYear
    2014
  • fDate
    Mar-14
  • Firstpage
    443
  • Lastpage
    448
  • Abstract
    In ITER, the superconducting coils will be connected with ac/dc converters by water-cooled aluminum busbars, whose segments will be interconnected by copper flexible inserts to compensate for cyclic thermal expansion. This paper presents the experimental data obtained during development and testing of high-current aluminum-copper contact connections with various coatings protecting against corrosion and oxidation including multilayer and composite coatings, coatings with an additional interlayer. With the testing results, the coating method has been chosen for the protection of the contact surfaces of aluminum busbars and flexible copper inserts, which will be used during manufacturing of the busbars for the power supply system of the ITER magnet system coils.
  • Keywords
    Tokamak devices; plasma toroidal confinement; superconducting coils; ITER DC busbar system; ITER magnet system coils; ac-dc converters; aluminum busbars; composite coatings; cyclic thermal expansion; flexible copper inserts; high current aluminum-copper contact connections; high-current aluminum-copper contact connections; multilayer coatings; power supply system; superconducting coils; water-cooled aluminum busbars; Aluminum; Coatings; Contact resistance; Copper; Nickel; Plasma temperature; Surface treatment; Accelerating aging tests; cold spraying; composite coating; electrical contact; high-current busbar; protective coating;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2013.2290703
  • Filename
    6687218