DocumentCode
3104022
Title
Improvement of reliability of closing latch in spring type operating mechanism of high voltage circuit breakers
Author
Yu, Li ; Xue, Xiaohui ; Wang, Jianhua ; Geng, Yingsan ; Liu, Zhiyuan ; Wei, Shiping ; You, Zhaogui
Author_Institution
State Key Lab. of Electr. Insulation & Power Equip., Xi´´an Jiaotong Univ., Xi´´an, China
fYear
2012
fDate
7-10 May 2012
Firstpage
1
Lastpage
4
Abstract
Occasionally closing operation failures occurred when a spring type operating mechanism was used to operate a high voltage circuit breaker with higher loads. This kind of failures is a high risk for circuit breakers. The objective of this paper is to propose a concept of reset time difference of a trip-open unit and to improve the reliability of closing operation of a high voltage circuit breaker with a spring type operating mechanism based on the reset time difference. In a spring type operating mechanism, there is a big latch and a small latch in a trip-open latch unit. In a close operation of a high voltage circuit breaker driven by a spring type operating mechanism, there is a time lag between the big latch and the small latch when they reach their final latched positions. And we definite the time lag as the reset time difference (TR). The experimental results showed that the reliability of closing operation can be guaranteed with TR was higher than 10ms. And TR increased with an increase of a preload of the big latch spring. And the bounces of the small latch were the most significant factor to cause a closing operation failure. An improvement from the point of view of time reset difference (TR) enhanced the reliability of closing operation of a high voltage circuit breaker.
Keywords
circuit breakers; fault diagnosis; reliability; big latch; closing latch; high voltage circuit breakers; reliability improvement; reset time difference; small latch; spring type operating mechanism; time lag; trip-open latch unit; trip-open unit; Circuit breakers; Integrated circuit reliability; Latches; Maintenance engineering; Power system reliability; Springs;
fLanguage
English
Publisher
ieee
Conference_Titel
Transmission and Distribution Conference and Exposition (T&D), 2012 IEEE PES
Conference_Location
Orlando, FL
ISSN
2160-8555
Print_ISBN
978-1-4673-1934-8
Electronic_ISBN
2160-8555
Type
conf
DOI
10.1109/TDC.2012.6281558
Filename
6281558
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