DocumentCode :
31041
Title :
A SiGe 8–18-GHz Receiver With Built-In-Testing Capability for Self-Healing Applications
Author :
Howard, Duane C. ; Saha, Prabir K. ; Shankar, Subramaniam ; England, Troy D. ; Cardoso, Adilson S. ; Diestelhorst, Ryan M. ; Seungwoo Jung ; Cressler, John D.
Author_Institution :
Jet Propulsion Lab., Pasadena, CA, USA
Volume :
62
Issue :
10
fYear :
2014
fDate :
Oct. 2014
Firstpage :
2370
Lastpage :
2380
Abstract :
A wideband (8-18 GHz) built-in test receiver in silicon-germanium technology is presented. The receiver chain consists of a low-noise amplifier (LNA), an image-reject mixer, on-chip automatic gain control ring oscillator sources that are used to provide test signals of a predefined amplitude, and control circuitry in the form of digital-to-analog converters and data registers. Both the LNA and the mixer circuit blocks incorporate tuning knobs to enable tuning of RF metrics to ensure consistent performance and mitigate the negative effects of process, voltage, and temperature variations, aging, and damage from extreme environments such as ionizing radiation. A maximum post-healed gain greater than 30 dB, an image rejection ratio exceeding 30 dB, output third-order intercept point greater than 8 dBm, and noise figure less than 9 dB are obtained in measurement. An automated healing algorithm was developed and shown to be effective at improving the overall performance of the receiver. The receiver was fabricated in an 0.18- μm SiGe BiCMOS process with a peak fT of 150 GHz, and consumes 240-260 mA from a 4-V supply.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; automatic gain control; built-in self test; digital-analogue conversion; low noise amplifiers; microwave amplifiers; microwave mixers; microwave oscillators; microwave receivers; semiconductor materials; BiCMOS process; LNA; RF metrics; SiGe; automated healing algorithm; control circuitry; current 240 mA to 260 mA; data registers; digital-to-analog converters; frequency 8 GHz to 18 GHz; image rejection ratio; image-reject mixer; ionizing radiation; low-noise amplifier; mixer circuit blocks; noise figure; on-chip automatic gain control ring oscillator sources; receiver chain; self-healing applications; silicon-germanium technology; size 0.18 mum; tuning knobs; voltage 4 V; wideband built-in test receiver; Frequency measurement; Gain measurement; Mixers; Noise measurement; Radio frequency; Receivers; Tuning; Built-in test (BIT); SiGe BiCMOS; built-in self-test (BIST); microwave integrated circuits (ICs); signal generation; tunable microwave circuits;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2014.2345334
Filename :
6879344
Link To Document :
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