DocumentCode :
3104179
Title :
An improved ROM architecture for bubble error suppression in high speed flash ADCs
Author :
Agrawal, Niket ; Paily, Roy
Author_Institution :
Indian Inst. of Technol., Guwahati
fYear :
2008
fDate :
15-26 Feb. 2008
Firstpage :
1
Lastpage :
5
Abstract :
In high speed flash ADCs, the thermometer coded output of the comparators is converted to binary code by a thermometer-to-binary decoder using a ROM. The ROM is simple and straightforward to design but it requires bubble error correction/suppression circuitry. A novel ROM architecture suitable for high speed operation with bubble error suppression is described in this paper. An 800 MHz 6-bit flash ADC is designed and simulated to verify the performance of different ROM architectures. The proposed ROM architecture eliminates the need of gray encoded ROM as well as gray to binary conversion circuitry, hence reduces the complexity and enhances the performance.
Keywords :
analogue-digital conversion; error correction; read-only storage; bubble error correction; bubble error suppression; frequency 800 MHz; high speed flash ADC; improved ROM architecture; thermometer-to-binary decoder; word length 6 bit; Circuits; Design engineering; Digital systems; Error correction; Laboratories; Logic; Preamplifiers; Read only memory; Signal to noise ratio; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Student Paper, 2008 Annual IEEE Conference
Conference_Location :
Aalborg
Print_ISBN :
978-1-4244-2156-5
Type :
conf
DOI :
10.1109/AISPC.2008.4460547
Filename :
4460547
Link To Document :
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