DocumentCode
3104179
Title
An improved ROM architecture for bubble error suppression in high speed flash ADCs
Author
Agrawal, Niket ; Paily, Roy
Author_Institution
Indian Inst. of Technol., Guwahati
fYear
2008
fDate
15-26 Feb. 2008
Firstpage
1
Lastpage
5
Abstract
In high speed flash ADCs, the thermometer coded output of the comparators is converted to binary code by a thermometer-to-binary decoder using a ROM. The ROM is simple and straightforward to design but it requires bubble error correction/suppression circuitry. A novel ROM architecture suitable for high speed operation with bubble error suppression is described in this paper. An 800 MHz 6-bit flash ADC is designed and simulated to verify the performance of different ROM architectures. The proposed ROM architecture eliminates the need of gray encoded ROM as well as gray to binary conversion circuitry, hence reduces the complexity and enhances the performance.
Keywords
analogue-digital conversion; error correction; read-only storage; bubble error correction; bubble error suppression; frequency 800 MHz; high speed flash ADC; improved ROM architecture; thermometer-to-binary decoder; word length 6 bit; Circuits; Design engineering; Digital systems; Error correction; Laboratories; Logic; Preamplifiers; Read only memory; Signal to noise ratio; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Student Paper, 2008 Annual IEEE Conference
Conference_Location
Aalborg
Print_ISBN
978-1-4244-2156-5
Type
conf
DOI
10.1109/AISPC.2008.4460547
Filename
4460547
Link To Document