• DocumentCode
    3104179
  • Title

    An improved ROM architecture for bubble error suppression in high speed flash ADCs

  • Author

    Agrawal, Niket ; Paily, Roy

  • Author_Institution
    Indian Inst. of Technol., Guwahati
  • fYear
    2008
  • fDate
    15-26 Feb. 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In high speed flash ADCs, the thermometer coded output of the comparators is converted to binary code by a thermometer-to-binary decoder using a ROM. The ROM is simple and straightforward to design but it requires bubble error correction/suppression circuitry. A novel ROM architecture suitable for high speed operation with bubble error suppression is described in this paper. An 800 MHz 6-bit flash ADC is designed and simulated to verify the performance of different ROM architectures. The proposed ROM architecture eliminates the need of gray encoded ROM as well as gray to binary conversion circuitry, hence reduces the complexity and enhances the performance.
  • Keywords
    analogue-digital conversion; error correction; read-only storage; bubble error correction; bubble error suppression; frequency 800 MHz; high speed flash ADC; improved ROM architecture; thermometer-to-binary decoder; word length 6 bit; Circuits; Design engineering; Digital systems; Error correction; Laboratories; Logic; Preamplifiers; Read only memory; Signal to noise ratio; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Student Paper, 2008 Annual IEEE Conference
  • Conference_Location
    Aalborg
  • Print_ISBN
    978-1-4244-2156-5
  • Type

    conf

  • DOI
    10.1109/AISPC.2008.4460547
  • Filename
    4460547