Title :
A defect inspection method for TFT panel using the compute unified device architecture (CUDA)
Author :
Jeong, Changki ; Yoo, JinWoo ; Park, PooGyeon
Author_Institution :
Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., Pohang, South Korea
Abstract :
In this paper, a parallel algorithm to inspect defects of thin film transistor liquid crystal displays (TFT-LCD) panel is presented. The algorithm is implemented on a graphics processing unit (GPU) using the compute unified device architecture (CUDA) development environment. The result shows better performance compared to the one implemented on a CPU.
Keywords :
coprocessors; inspection; liquid crystal displays; parallel algorithms; thin film transistors; TFT-LCD panel; compute unified device architecture; defect inspection method; graphics processing unit; parallel algorithm; thin film transistor liquid crystal displays; Cameras; Central Processing Unit; Computer architecture; Computer displays; Graphics; Inspection; Liquid crystal displays; Memory management; Signal processing algorithms; Thin film transistors;
Conference_Titel :
Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-4347-5
Electronic_ISBN :
978-1-4244-4349-9
DOI :
10.1109/ISIE.2009.5213112
