Title :
Nonlinear HEMT model direct formulated from the second-order derivative of the I–V/ Q-V characteristics
Author :
Liu, L. ; Ma, Jiaxin ; Wu, Huwei ; Ng, Gillian ; Zhang, Qi
Author_Institution :
Univ. ofElectronic Sci. & Technol. of China, Chengdu, China
Abstract :
In this paper, an empirical nonlinear model for high electron mobility transistors (HEMTs) is presented. Unlike the conventional large-signal models whose fitting parameters are coupled to the measured I-V and C-V characteristics, the proposed modeling equations are direct formulated from the second-order derivative of drain current (I-V) and gate charge (Q-V) with respect to gate voltage. As a consequence, the proposed large-signal model is kept continuously differentiable and accurate enough to the higher-order I-V and Q-V derivatives. Measured and modeled results are compared for the 0.25 μm gate-length GaAs pseudomorphic HEMTs (pHEMTs), and good agreement is obtained.
Keywords :
III-V semiconductors; gallium arsenide; high electron mobility transistors; semiconductor device models; wide band gap semiconductors; GaAs; Q-V characteristics; drain current; empirical nonlinear HEMT model; gate charge; gate voltage; high electron mobility transistors; l-V characteristics; large-signal models; pseudomorphic HEMT; second-order derivative; size 0.25 mum; Capacitance-voltage characteristics; Charge measurement; Current measurement; Fitting; Gallium arsenide; HEMTs; MODFETs; Nonlinear equations; PHEMTs; Voltage;
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2010.5515677