Title :
Outage analysis of a secondary user in overlay/underlay model
Author :
Yadav, Kuldeep ; Prasad, Binod ; Roy, Sanjay Dhar ; Kundu, Sumit
Author_Institution :
Dept. of Electron. & Commun. Eng, NIT Durgapur, Durgapur, India
Abstract :
In this paper, we derive exact expression for the outage probability of the secondary user in a cognitive radio network under the combined underlay/overlay model in the presence of Rayleigh fading. We analyze the impact of various key parameters on outage probability. The theoretical analysis is validated by simulations.
Keywords :
Rayleigh channels; cognitive radio; overlay networks; probability; telecommunication network reliability; Rayleigh fading; cognitive radio network; outage analysis; outage probability; overlay-underlay model; secondary user; Analytical models; Cognitive radio; Fading; Interference; Knowledge management; Market research; Signal to noise ratio; Cognitive radio; Outage probability; Overlay; Rayleigh faded channel; Underlay;
Conference_Titel :
Futuristic Trends on Computational Analysis and Knowledge Management (ABLAZE), 2015 International Conference on
Conference_Location :
Noida
Print_ISBN :
978-1-4799-8432-9
DOI :
10.1109/ABLAZE.2015.7154923
