DocumentCode
3105274
Title
Control Strategies in Atomic Force Microscopy
Author
Stemmer, Andreas
Author_Institution
Swiss Federal Institute of Technology
fYear
2005
fDate
12-15 Dec. 2005
Firstpage
11
Lastpage
11
Keywords
Atomic force microscopy; Force control; Instruments; Laboratories; Motion control; Nanobioscience; Nanotechnology; Physics; Pi control; Proportional control;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 2005 and 2005 European Control Conference. CDC-ECC '05. 44th IEEE Conference on
Print_ISBN
0-7803-9567-0
Type
conf
DOI
10.1109/CDC.2005.1582108
Filename
1582108
Link To Document