Title :
Control Strategies in Atomic Force Microscopy
Author :
Stemmer, Andreas
Author_Institution :
Swiss Federal Institute of Technology
Keywords :
Atomic force microscopy; Force control; Instruments; Laboratories; Motion control; Nanobioscience; Nanotechnology; Physics; Pi control; Proportional control;
Conference_Titel :
Decision and Control, 2005 and 2005 European Control Conference. CDC-ECC '05. 44th IEEE Conference on
Print_ISBN :
0-7803-9567-0
DOI :
10.1109/CDC.2005.1582108