DocumentCode :
3105274
Title :
Control Strategies in Atomic Force Microscopy
Author :
Stemmer, Andreas
Author_Institution :
Swiss Federal Institute of Technology
fYear :
2005
fDate :
12-15 Dec. 2005
Firstpage :
11
Lastpage :
11
Keywords :
Atomic force microscopy; Force control; Instruments; Laboratories; Motion control; Nanobioscience; Nanotechnology; Physics; Pi control; Proportional control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control, 2005 and 2005 European Control Conference. CDC-ECC '05. 44th IEEE Conference on
Print_ISBN :
0-7803-9567-0
Type :
conf
DOI :
10.1109/CDC.2005.1582108
Filename :
1582108
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3105274
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