• DocumentCode
    3105303
  • Title

    How Bayesians Debug

  • Author

    Liu, Chao ; Lian, Zeng ; Han, Jiawei

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Urbana, IL
  • fYear
    2006
  • fDate
    18-22 Dec. 2006
  • Firstpage
    382
  • Lastpage
    393
  • Abstract
    Manual debugging is expensive. And the high cost has motivated extensive research on automated fault localization in both software engineering and data mining communities. Fault localization aims at automatically locating likely fault locations, and hence assists manual debugging. A number of fault localization algorithms have been developed in recent years, which prove effective when multiple failing and passing cases are available. However, we notice what is more commonly encountered in practice is the two-sample debugging problem, where only one failing and one passing cases are available. This problem has been either overlooked or insufficiently tackled in previous studies. In this paper, we develop a new fault localization algorithm, named BayesDebug, which simulates some manual debugging principles through a Bayesian approach. Different from existing approaches that base fault analysis on multiple passing and failing cases, BayesDebug only requires one passing and one failing cases. We reason about why BayesDebug fits the two- sample debugging problem and why other approaches do not. Finally, an experiment with a real-world program grep-2.2 is conducted, which exemplifies the effectiveness of BayesDebug.
  • Keywords
    Bayes methods; program debugging; software reliability; BayesDebug; automated debugging; automated fault localization; data mining; fault analysis; software engineering; Bayesian methods; Chaos; Computer science; Costs; Data mining; Debugging; Fault location; Instruments; NIST; Software engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Mining, 2006. ICDM '06. Sixth International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1550-4786
  • Print_ISBN
    0-7695-2701-7
  • Type

    conf

  • DOI
    10.1109/ICDM.2006.83
  • Filename
    4053065