DocumentCode
3105303
Title
How Bayesians Debug
Author
Liu, Chao ; Lian, Zeng ; Han, Jiawei
Author_Institution
Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Urbana, IL
fYear
2006
fDate
18-22 Dec. 2006
Firstpage
382
Lastpage
393
Abstract
Manual debugging is expensive. And the high cost has motivated extensive research on automated fault localization in both software engineering and data mining communities. Fault localization aims at automatically locating likely fault locations, and hence assists manual debugging. A number of fault localization algorithms have been developed in recent years, which prove effective when multiple failing and passing cases are available. However, we notice what is more commonly encountered in practice is the two-sample debugging problem, where only one failing and one passing cases are available. This problem has been either overlooked or insufficiently tackled in previous studies. In this paper, we develop a new fault localization algorithm, named BayesDebug, which simulates some manual debugging principles through a Bayesian approach. Different from existing approaches that base fault analysis on multiple passing and failing cases, BayesDebug only requires one passing and one failing cases. We reason about why BayesDebug fits the two- sample debugging problem and why other approaches do not. Finally, an experiment with a real-world program grep-2.2 is conducted, which exemplifies the effectiveness of BayesDebug.
Keywords
Bayes methods; program debugging; software reliability; BayesDebug; automated debugging; automated fault localization; data mining; fault analysis; software engineering; Bayesian methods; Chaos; Computer science; Costs; Data mining; Debugging; Fault location; Instruments; NIST; Software engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Mining, 2006. ICDM '06. Sixth International Conference on
Conference_Location
Hong Kong
ISSN
1550-4786
Print_ISBN
0-7695-2701-7
Type
conf
DOI
10.1109/ICDM.2006.83
Filename
4053065
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