Title :
Characterization of Single and Dual Layer Anti Reflecting Coating (ARC) for Solar Cell Applications
Author :
Zoolfakar, A.S. ; Othman, S.R.S. ; Abdullah, Mohd Harun
Author_Institution :
Fac. of Electr. Eng., Univ. Teknol. MARA, Shah Alam, Malaysia
Abstract :
In this research, the characterization of single and dual layer of anti reflection coating films are studied. The research is aim to compare the performance of single and dual layer of anti reflection coating film for solar cell application. In addition, several types of anti reflection coating films are also studied. The research has been carried by using Silvaco TCAD. It is desire to achieve higher efficiency and lower reflectance. It was concluded that dual layer of silicon nitride film managed to produce higher efficiency and lower reflectance values.
Keywords :
antireflection coatings; reflectivity; semiconductor thin films; silicon compounds; solar cells; technology CAD (electronics); SiN; Silvaco TCAD; dual layer antireflecting coating film; reflectance value; silicon nitride film; single layer antireflection coating film; solar cell applications; Coatings; Equations; Optical films; Optical reflection; Optical surface waves; Photovoltaic cells; Reflectivity; Refractive index; Semiconductor films; Silicon compounds; Anti-Reflection Coating (ARCs); Dual layer Silicon Dioxide (DLSiO2); Dual layer Silicon Nitride (DLSiN); Efficiency; Reflectance; Single layer Silicon Dioxide (SLSiO2); Single layer Silicon Nitride (SLSiN);
Conference_Titel :
Information and Multimedia Technology, 2009. ICIMT '09. International Conference on
Conference_Location :
Jeju Island
Print_ISBN :
978-0-7695-3922-5
DOI :
10.1109/ICIMT.2009.52
