Title :
Vapor SIMD: Auto-vectorize once, run everywhere
Author :
Nuzman, Dorit ; Dyshel, Sergei ; Rohou, Erven ; Rosen, Ira ; Williams, Kevin ; Yuste, David ; Cohen, Albert ; Zaks, Ayal
Author_Institution :
IBM Haifa Res. Lab., HiPEAC, Haifa, Israel
Abstract :
Just-in-Time (JIT) compiler technology offers portability while facilitating target- and context-specific specialization. Single-Instruction-Multiple-Data (SIMD) hardware is ubiquitous and markedly diverse, but can be difficult for JIT compilers to efficiently target due to resource and budget constraints. We present our design for a synergistic auto-vectorizing compilation scheme. The scheme is composed of an aggressive, generic offline stage coupled with a lightweight, target-specific online stage. Our method leverages the optimized intermediate results provided by the first stage across disparate SIMD architectures from different vendors, having distinct characteristics ranging from different vector sizes, memory alignment and access constraints, to special computational idioms. We demonstrate the effectiveness of our design using a set of kernels that exercise innermost loop, outer loop, as well as straight-line code vectorization, all automatically extracted by the common offline compilation stage. This results in performance comparable to that provided by specialized monolithic offline compilers. Our framework is implemented using open-source tools and standards, thereby promoting interoperability and extendibility.
Keywords :
open systems; parallel processing; program compilers; program interpreters; aggressive generic offline stage; interoperability; just-in-time compiler technology; lightweight target-specific online stage; memory alignment; open-source tools; single-instruction-multiple-data hardware; straight-line code vectorization; synergistic auto-vectorizing compilation scheme; vapor SIMD architecture; Arrays; Complexity theory; Electronic mail; Optimization; Registers; Semantics;
Conference_Titel :
Code Generation and Optimization (CGO), 2011 9th Annual IEEE/ACM International Symposium on
Conference_Location :
Chamonix
Print_ISBN :
978-1-61284-356-8
Electronic_ISBN :
978-1-61284-358-2
DOI :
10.1109/CGO.2011.5764683