Title :
Matching the IEEE Test Feeder short circuit results
Author :
Arritt, R.F. ; Dugan, R.C.
Author_Institution :
EPRI, Knoxville, TN, USA
Abstract :
The IEEE Test Feeders provide a benchmark for the power distribution systems analysis community. This panel summary will provide a discussion of experiences matching the results published by Kersting and Shirek in this panel. [1] Benchmarking the short circuit currents for the Test Feeders is important to users of the Test Feeders for determining whether the system impedances are defined correctly and if the computational methods are sound. Results of the short circuit currents of various Test Feeders are provided as computed by the EPRI OpenDSS program. [2]
Keywords :
IEEE standards; power distribution; short-circuit currents; EPRI OpenDSS program; IEEE test feeder short circuit results; power distribution system analysis community; Benchmark testing; Circuit faults; Impedance; Integrated circuit modeling; Load flow; Regulators; Voltage control; Power Distribution System Analysis; distribution; short circuit results; test feeder;
Conference_Titel :
Transmission and Distribution Conference and Exposition (T&D), 2012 IEEE PES
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-1934-8
Electronic_ISBN :
2160-8555
DOI :
10.1109/TDC.2012.6281653
