• DocumentCode
    3105839
  • Title

    Matching the IEEE Test Feeder short circuit results

  • Author

    Arritt, R.F. ; Dugan, R.C.

  • Author_Institution
    EPRI, Knoxville, TN, USA
  • fYear
    2012
  • fDate
    7-10 May 2012
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    The IEEE Test Feeders provide a benchmark for the power distribution systems analysis community. This panel summary will provide a discussion of experiences matching the results published by Kersting and Shirek in this panel. [1] Benchmarking the short circuit currents for the Test Feeders is important to users of the Test Feeders for determining whether the system impedances are defined correctly and if the computational methods are sound. Results of the short circuit currents of various Test Feeders are provided as computed by the EPRI OpenDSS program. [2]
  • Keywords
    IEEE standards; power distribution; short-circuit currents; EPRI OpenDSS program; IEEE test feeder short circuit results; power distribution system analysis community; Benchmark testing; Circuit faults; Impedance; Integrated circuit modeling; Load flow; Regulators; Voltage control; Power Distribution System Analysis; distribution; short circuit results; test feeder;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transmission and Distribution Conference and Exposition (T&D), 2012 IEEE PES
  • Conference_Location
    Orlando, FL
  • ISSN
    2160-8555
  • Print_ISBN
    978-1-4673-1934-8
  • Electronic_ISBN
    2160-8555
  • Type

    conf

  • DOI
    10.1109/TDC.2012.6281653
  • Filename
    6281653