Title :
Model-based fault diagnosis of sequential circuits and its acceleration
Author :
Rogel-Favila, Benjamin ; Wakeling, Antony ; Cheung, Peter Y Kay
Author_Institution :
Dept. of Electr. Eng., Imperial Coll. of Sci., Technol. & Med., London, UK
Abstract :
Describes an algorithm for the location of faulty components in digital circuits using the model-based approach to circuit fault diagnosis. The model-based approach is first extended to apply to synchronous sequential circuits. Acceleration strategies that exploit domain knowledge particular to digital circuits are then proposed. The effect of these acceleration strategies is a drastic reduction in the execution time of the diagnosis procedure. The effectiveness and performance of the diagnosis algorithm are illustrated through an example for which encouraging results are obtained
Keywords :
fault location; logic testing; sequential circuits; acceleration strategies; circuit fault diagnosis; diagnosis algorithm; diagnosis procedure; digital circuits; domain knowledge; fault diagnosis of sequential circuits; location of faulty components; model-based approach; Acceleration; Back; Circuit faults; Digital circuits; Educational institutions; Electrical fault detection; Fault detection; Fault diagnosis; Medical diagnostic imaging; Sequential circuits;
Conference_Titel :
Design Automation. EDAC., Proceedings of the European Conference on
Conference_Location :
Amsterdam
DOI :
10.1109/EDAC.1991.206395