• DocumentCode
    3106146
  • Title

    The theoretical analysis and compensating experiment of voltage fluctuation

  • Author

    Dai, Chengxin ; Yin, Zhongdong ; Hong, Qiu ; Kong, Shuhong

  • Author_Institution
    Key Lab. of Power Syst. Protection & Dynamic Security Monitoring & Control of Minist. of Educ., North China Electr. Power Univ., Beijing, China
  • fYear
    2010
  • fDate
    15-17 June 2010
  • Firstpage
    989
  • Lastpage
    992
  • Abstract
    This paper researches the intrinsic relationship between inter-harmonics and typical voltage fluctuations of which the enveloping line is sine wave, it analyses the effects to voltage fluctuations of inter-harmonics of different frequencies, including a single inter-harmonic and a pair of inter-harmonics. In this paper, experiments of voltage fluctuations production and compensation are all carried out. The disturbance producing device makes use of different frequency voltage to modulate inverter output voltage, then the output voltage is superimposed on system voltage, at last voltage fluctuation waveforms of different frequency are produced, the voltage compensation device firstly detect the output voltage of disturbance producing device, and the standard reference 220V is subtracted from it, the result is used to modulate the output voltage of the compensation device, and it get a good compensation effect.
  • Keywords
    invertors; power supply quality; compensating experiment; frequency voltage; inter-harmonics; intrinsic relationship; modulate inverter output voltage; power system; theoretical analysis; voltage 220 V; voltage fluctuation; voltage fluctuation waveforms; Frequency conversion; Furnaces; Harmonic analysis; Information analysis; Inverters; Laboratories; Power system harmonics; Power systems; Signal analysis; Voltage fluctuations; disturbance; flicker; inter-harmonics; voltage compensation; voltage fluctuation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ICIEA), 2010 the 5th IEEE Conference on
  • Conference_Location
    Taichung
  • Print_ISBN
    978-1-4244-5045-9
  • Electronic_ISBN
    978-1-4244-5046-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2010.5515746
  • Filename
    5515746