DocumentCode :
3106146
Title :
The theoretical analysis and compensating experiment of voltage fluctuation
Author :
Dai, Chengxin ; Yin, Zhongdong ; Hong, Qiu ; Kong, Shuhong
Author_Institution :
Key Lab. of Power Syst. Protection & Dynamic Security Monitoring & Control of Minist. of Educ., North China Electr. Power Univ., Beijing, China
fYear :
2010
fDate :
15-17 June 2010
Firstpage :
989
Lastpage :
992
Abstract :
This paper researches the intrinsic relationship between inter-harmonics and typical voltage fluctuations of which the enveloping line is sine wave, it analyses the effects to voltage fluctuations of inter-harmonics of different frequencies, including a single inter-harmonic and a pair of inter-harmonics. In this paper, experiments of voltage fluctuations production and compensation are all carried out. The disturbance producing device makes use of different frequency voltage to modulate inverter output voltage, then the output voltage is superimposed on system voltage, at last voltage fluctuation waveforms of different frequency are produced, the voltage compensation device firstly detect the output voltage of disturbance producing device, and the standard reference 220V is subtracted from it, the result is used to modulate the output voltage of the compensation device, and it get a good compensation effect.
Keywords :
invertors; power supply quality; compensating experiment; frequency voltage; inter-harmonics; intrinsic relationship; modulate inverter output voltage; power system; theoretical analysis; voltage 220 V; voltage fluctuation; voltage fluctuation waveforms; Frequency conversion; Furnaces; Harmonic analysis; Information analysis; Inverters; Laboratories; Power system harmonics; Power systems; Signal analysis; Voltage fluctuations; disturbance; flicker; inter-harmonics; voltage compensation; voltage fluctuation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2010 the 5th IEEE Conference on
Conference_Location :
Taichung
Print_ISBN :
978-1-4244-5045-9
Electronic_ISBN :
978-1-4244-5046-6
Type :
conf
DOI :
10.1109/ICIEA.2010.5515746
Filename :
5515746
Link To Document :
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