DocumentCode :
3106175
Title :
FEM analysis of the transformer insulation XY model
Author :
Cheng, J. ; Werelius, P. ; Ohlen, M.
Author_Institution :
Transformer Test Syst., Sweden
fYear :
2012
fDate :
7-10 May 2012
Firstpage :
1
Lastpage :
5
Abstract :
Dielectric Frequency Response, DFR (also known as Frequency Domain Spectroscopy, FDS), was introduced more than 20 years and has been thoroughly evaluated and proven in a number of research projects as and field tests with good results. DFR data in combination with mathematical modeling of the oil-paper insulation is proven as an excellent tool for understanding insulation properties e.g. moisture content in cellulose insulation and temperature dependence of the insulation system. The traditional XY model is widely known for describing the dielectric response of the paper-oil insulation system. This paper explores the accuracy and limitation of the XY model by comparing it with FEM using COMSOL Multiphysics. The `hump´ phenomenon that sometimes is seen in field measurement and cannot be described by the simple XY-model is also investigated by using the FEM technique. The analysis shows that the deviation in the frequency response can be described and modeled as a semi-conductive layer with a certain conductivity and thickness.
Keywords :
finite element analysis; frequency response; mathematical analysis; power transformer insulation; transformer oil; COMSOL Multiphysics; DFR data; FDS; FEM analysis; dielectric frequency response; field tests; frequency domain spectroscopy; hump phenomenon; mathematical modeling; moisture content; paper-oil insulation system; semiconductive layer; temperature dependence; transformer insulation XY model; Capacitors; Contamination; Finite element methods; Insulation; Permittivity; Power transformers; Cellulose; DFR; FDS; FEM; dielectric response; insulation; modeling; power transformer; semi-conductive layer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transmission and Distribution Conference and Exposition (T&D), 2012 IEEE PES
Conference_Location :
Orlando, FL
ISSN :
2160-8555
Print_ISBN :
978-1-4673-1934-8
Electronic_ISBN :
2160-8555
Type :
conf
DOI :
10.1109/TDC.2012.6281667
Filename :
6281667
Link To Document :
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