DocumentCode :
3106202
Title :
TATOO: an industrial timing analyzer with false path elimination and test pattern generation
Author :
Benkoski, Jacques ; Stewart, Ronald H.
Author_Institution :
SGS-Thomson Microelectron., Grenoble, France
fYear :
1991
fDate :
25-28 Feb 1991
Firstpage :
256
Lastpage :
260
Abstract :
TATOO is an industrial interactive timing analysis system evolved from recently developed false path elimination algorithms. These have been extended to perform more complex searches that facilitate the rapid survey of a network. An automatic test pattern generation mechanism which exercises the statically sensitizable paths has been developed. This forms a direct link to an electrical simulator. The critical path through a network of hundreds of gates is found, the test pattern generated, the critical path simulated, and the resulting waveforms displayed in less than two minutes
Keywords :
automatic testing; circuit analysis computing; logic testing; TATOO; critical path simulation; false path elimination; industrial timing analyzer; statically sensitizable paths; test pattern generation; Algorithm design and analysis; Automatic testing; Circuit simulation; Circuit testing; Logic testing; Pattern analysis; Signal analysis; Test pattern generators; Timing; Upper bound;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation. EDAC., Proceedings of the European Conference on
Conference_Location :
Amsterdam
Type :
conf
DOI :
10.1109/EDAC.1991.206403
Filename :
206403
Link To Document :
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