DocumentCode
3106415
Title
A geometric-primitives-based compression scheme for testing systems-on-a-chip
Author
El-Maleh, Alman ; Al Zahir, Saif ; Khan, Esam
Author_Institution
King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
fYear
2001
fDate
2001
Firstpage
54
Lastpage
59
Abstract
The increasing complexity of systems-on-a-chip with the accompanied increase in their test data size has made the need for test data reduction imperative. In this paper we introduce a novel and very efficient lossless compression technique for testing systems-on-a-chip based on geometric shapes. The technique exploits reordering of test vectors to minimize the number of shapes needed to encode the test data. The effectiveness of the technique in achieving high compression ratio is demonstrated on the largest ISCAS85 and full-scanned versions of ISCAS89 benchmark circuits. In this paper, it is assumed that an embedded core will be used to execute the decompression algorithm and decompress the test data
Keywords
application specific integrated circuits; automatic testing; data compression; geometric codes; integrated circuit testing; logic testing; ISCAS85 benchmark circuits; ISCAS89 benchmark circuits; compression ratio; decompression algorithm; embedded core; geometric shapes; geometric-primitives-based compression scheme; lossless compression technique; systems-on-a-chip; test data reduction; test data size; test vectors; Automatic test pattern generation; Channel capacity; Circuit faults; Circuit testing; Compaction; Costs; Shape; System testing; System-on-a-chip; Test data compression;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Conference_Location
Marina Del Rey, CA
Print_ISBN
0-7695-1122-8
Type
conf
DOI
10.1109/VTS.2001.923418
Filename
923418
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