• DocumentCode
    3106415
  • Title

    A geometric-primitives-based compression scheme for testing systems-on-a-chip

  • Author

    El-Maleh, Alman ; Al Zahir, Saif ; Khan, Esam

  • Author_Institution
    King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    54
  • Lastpage
    59
  • Abstract
    The increasing complexity of systems-on-a-chip with the accompanied increase in their test data size has made the need for test data reduction imperative. In this paper we introduce a novel and very efficient lossless compression technique for testing systems-on-a-chip based on geometric shapes. The technique exploits reordering of test vectors to minimize the number of shapes needed to encode the test data. The effectiveness of the technique in achieving high compression ratio is demonstrated on the largest ISCAS85 and full-scanned versions of ISCAS89 benchmark circuits. In this paper, it is assumed that an embedded core will be used to execute the decompression algorithm and decompress the test data
  • Keywords
    application specific integrated circuits; automatic testing; data compression; geometric codes; integrated circuit testing; logic testing; ISCAS85 benchmark circuits; ISCAS89 benchmark circuits; compression ratio; decompression algorithm; embedded core; geometric shapes; geometric-primitives-based compression scheme; lossless compression technique; systems-on-a-chip; test data reduction; test data size; test vectors; Automatic test pattern generation; Channel capacity; Circuit faults; Circuit testing; Compaction; Costs; Shape; System testing; System-on-a-chip; Test data compression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
  • Conference_Location
    Marina Del Rey, CA
  • Print_ISBN
    0-7695-1122-8
  • Type

    conf

  • DOI
    10.1109/VTS.2001.923418
  • Filename
    923418